Vol. 9, Issue 2, Part E (2025)

This study explores the genetic basis of yield and related traits in wheat using a cross between NIAW 34 (Trimbak) and HI 1633 (Pusa Vani) genotypes. Data from five generations (P₁, P₂, F₁, F₂, and F₃) were analyzed for phenotypic traits, including days to flowering, days to maturity, plant height, tillers per plant, spike length, spikelets per spike, grains per spike, yield per plant, and 1000-grain weight. Significant genetic variability was observed across traits, with hybrid vigor evident in the F₁ generation for parameters such as plant height, tillers per plant, and spikelets per spike. Additive and dominance gene effects, along with epistatic interactions, were identified as key contributors to trait inheritance. The inadequacy of the additive-dominance model necessitated the use of a five-parameter model to account for epistasis. Traits such as plant height and tillers per plant showed high genetic variability, indicating strong potential for selection-based improvement. Genetic advances as percent of mean were high for tillers per plant, spikelets per spike and yield per plant. The findings underscore the importance of non-additive gene effects and advocate breeding strategies like biparental mating and recurrent selection to optimize wheat yield under diverse conditions.